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Crystal Growth Load Meter TT-XN/TT-XN (G)
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The Crystal Growth Load Meter is a load sensor that changes weight into an electronic signal for the purpose of diameter control of single crystal growth in manufacturing processes such as those for semiconductors.
· It consists of a load sensitivity part (load cell), an amplification part, a slip ring, and the housing it is contained in.
· The load sensitivity part uses a high performance/high resolution load cell with nonlinear and hysteresis characteristics and a repeatability of 0.02%R.O.
· Its temperature characteristics are very stable with 0.03%R.O./10 degrees C (zero point change + sensitivity change).
· It is superb in terms of revolution noise.
· As there is an overload safeguard function for loads from an opposite direction, it is safe even in the case of overloading.
· A model that can be used for raising in a vacuum is also available.

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